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N. Unnikrishnan Nair
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S.M. Sunoj
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G. Rajesh
pubblicato da
CRC Press
The book deals with the application of various measures of information like the entropy, divergence, inaccuracy, etc. in modelling lifetimes of devices or equipment in reliability analysis. This is an emerging area of study and research during the last two decades and is of potential interest in many fields. In this work the classical measures of uncertainty are sufficiently modified to meet the needs of lifetime data analysis. The book provides an exhaustive collection of materials in a single volume to make it a comprehensive source of reference.
The first treatise on the subject. It brings together the work that have appeared in journals on different disciplines. It will serve as a text for graduate students and practioners of special studies in information theory, as well as statistics and as a reference book for researchers. The book contains illustrative examples, tables and figures for clarifying the concepts and methodologies, the book is self-contained. It helps students to access information relevant to careers in industry, engineering, applied statistics, etc.
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